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1st Detect Awarded U.S. Patent for Novel Mass Spectrometer Gain Control Technology

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AUSTIN, Texas--(BUSINESS WIRE)--1st Detect Corporation, a subsidiary of Astrotech Corporation (Nasdaq:ASTC), announced today that the United States Patent and Trademark Office (“USPTO”) has allowed the issuance of a key patent for increasing the performance of the company’s unique ion trap mass spectrometer used for chemical analysis and detection. “We are pleased that the USPTO has allowed this patent as it enables 1st Detect to significantly expand the number of applications and customers tha

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